A Modified Model Dielectric Function for Analyzing Optical Spectra of InGaN Nanofilms on Sapphire Substrates

Devki N. Talwar, Hao Hsiung Lin, Jason T. Haraldsen

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number485
JournalNanomaterials
Volume15
Issue number7
DOIs
StatePublished - Apr 2025

ASJC Scopus Subject Areas

  • General Chemical Engineering
  • General Materials Science

Keywords

  • absorption and transmission spectra
  • GaN
  • InxGa1−xN/Sapphire film thickness
  • model dielectric function
  • optical constants of InN
  • reflectivity
  • transfer matrix method

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