A reflection-mode apertureless scanning near-field optical microscope developed from a commercial scanning probe microscope

G. Wurtz, R. Bachelot, P. Royer

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1735-1743
Number of pages9
JournalReview of Scientific Instruments
Volume69
Issue number4
DOIs
StatePublished - Apr 1998
Externally publishedYes

ASJC Scopus Subject Areas

  • Instrumentation

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