Annealing condition optimization and electrical characterization of amorphous LaAl O3 GaAs metal-oxide-semiconductor capacitors

Donghun Choi, James S. Harris, Maitri Warusawithana, Darrell G. Schlom

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number243505
JournalApplied Physics Letters
Volume90
Issue number24
DOIs
StatePublished - 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • Physics and Astronomy (miscellaneous)

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