Cantilever testing of sintered-silver interconnects

  • Andrew A. Wereszczak
  • , Branndon R. Chen
  • , Osama M. Jadaan
  • , Brian A. Oistad
  • , Max C. Modugno
  • , Jeffrey W. Sharp
  • , James R. Salvador

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
JournalJournal of Materials Science: Materials in Electronics
Volume29
DOIs
StatePublished - Jan 1 2018
Externally publishedYes

Disciplines

  • Materials Science and Engineering

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