Fault detection effectiveness of metamorphic relations developed for testing supervised classifiers

Prashanta Saha, Upulee Kanewala

Research output: Chapter or Contribution to BookLiterary contribution

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE International Conference on Artificial Intelligence Testing, AITest 2019
Pages157-164
Number of pages8
ISBN (Electronic)9781728104928
DOIs
StatePublished - May 17 2019
Externally publishedYes
Event1st IEEE International Conference on Artificial Intelligence Testing, AITest 2019 - Newark, United States
Duration: Apr 4 2019Apr 9 2019

Publication series

NameProceedings - 2019 IEEE International Conference on Artificial Intelligence Testing, AITest 2019

Conference

Conference1st IEEE International Conference on Artificial Intelligence Testing, AITest 2019
Country/TerritoryUnited States
CityNewark
Period4/4/194/9/19

ASJC Scopus Subject Areas

  • Artificial Intelligence
  • Safety, Risk, Reliability and Quality

Keywords

  • Machine Learning
  • Metamorphic relations
  • Metamorphic testing
  • Mutation Analysis
  • Random testing
  • Supervised classifiers

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