Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

Madhusudan Srinivasan; Upulee Kanewala

doi:10.3390/electronics13173380

Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

Madhusudan Srinivasan, Upulee Kanewala

School of Computing

East Carolina University

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	3380
Journal	Electronics (Switzerland)
Volume	13
Issue number	17
DOIs	https://doi.org/10.3390/electronics13173380
State	Published - Sep 2024

ASJC Scopus Subject Areas

Control and Systems Engineering
Signal Processing
Hardware and Architecture
Computer Networks and Communications
Electrical and Electronic Engineering

Keywords

metamorphic relation prioritization
metamorphic relations
metamorphic testing
software testing
test prioritization
testing and validation

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10.3390/electronics13173380

Cite this

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author = "Madhusudan Srinivasan and Upulee Kanewala",

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Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

ASJC Scopus Subject Areas

Keywords

Access to Document

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