Interface characterization in III-V CMOS nanoelectronics

L. V. Goncharova; O. Celik; T. Gustafsson; E. Garfunkel; M. Warusawithana; D. G. Schlom; H. Wen; M. B. Santos; Safak Sayan; Wilman Tsai; Niti Goel

doi:10.1149/1.2779553

Interface characterization in III-V CMOS nanoelectronics

L. V. Goncharova
, O. Celik
, T. Gustafsson
, E. Garfunkel
, M. Warusawithana
, D. G. Schlom
, H. Wen
, M. B. Santos
, Safak Sayan
, Wilman Tsai
, Niti Goel

Rutgers University–New Brunswick
Pennsylvania State University
Univ. of Oklahoma
Intel Corporation

Research output: Chapter or Contribution to Book › Literary contribution

Original language	English
Title of host publication	ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks
Pages	117-122
Number of pages	6
Edition	4
ISBN (Electronic)	9781566775700
DOIs	https://doi.org/10.1149/1.2779553
State	Published - 2007
Externally published	Yes
Event	5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting - Washington, DC, United States Duration: Oct 8 2007 → Oct 10 2007

Publication series

Name	ECS Transactions
Number	4
Volume	11
ISSN (Print)	1938-5862
ISSN (Electronic)	1938-6737

Conference

Conference	5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting
Country/Territory	United States
City	Washington, DC
Period	10/8/07 → 10/10/07

ASJC Scopus Subject Areas

General Engineering

Access to Document

10.1149/1.2779553

Cite this

Goncharova, L. V., Celik, O., Gustafsson, T., Garfunkel, E., Warusawithana, M., Schlom, D. G., Wen, H., Santos, M. B., Sayan, S., Tsai, W., & Goel, N. (2007). Interface characterization in III-V CMOS nanoelectronics. In ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks (4 ed., pp. 117-122). (ECS Transactions; Vol. 11, No. 4). https://doi.org/10.1149/1.2779553

Goncharova, LV, Celik, O, Gustafsson, T, Garfunkel, E, Warusawithana, M, Schlom, DG, Wen, H, Santos, MB, Sayan, S, Tsai, W & Goel, N 2007, Interface characterization in III-V CMOS nanoelectronics. in ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks. 4 edn, ECS Transactions, no. 4, vol. 11, pp. 117-122, 5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting, Washington, DC, United States, 10/8/07. https://doi.org/10.1149/1.2779553

@inproceedings{e23c9ce82b634f6dbc4d7f425ec9b959,

title = "Interface characterization in III-V CMOS nanoelectronics",

author = "Goncharova, \{L. V.\} and O. Celik and T. Gustafsson and E. Garfunkel and M. Warusawithana and Schlom, \{D. G.\} and H. Wen and Santos, \{M. B.\} and Safak Sayan and Wilman Tsai and Niti Goel",

year = "2007",

doi = "10.1149/1.2779553",

language = "English",

isbn = "9781566775700",

series = "ECS Transactions",

number = "4",

pages = "117--122",

booktitle = "ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks",

edition = "4",

note = "5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting ; Conference date: 08-10-2007 Through 10-10-2007",

}

TY - GEN

T1 - Interface characterization in III-V CMOS nanoelectronics

AU - Goncharova, L. V.

AU - Celik, O.

AU - Gustafsson, T.

AU - Garfunkel, E.

AU - Warusawithana, M.

AU - Schlom, D. G.

AU - Wen, H.

AU - Santos, M. B.

AU - Sayan, Safak

AU - Tsai, Wilman

AU - Goel, Niti

PY - 2007

Y1 - 2007

UR - https://www.scopus.com/pages/publications/45249088756

UR - https://www.scopus.com/pages/publications/45249088756#tab=citedBy

U2 - 10.1149/1.2779553

DO - 10.1149/1.2779553

M3 - Literary contribution

AN - SCOPUS:45249088756

SN - 9781566775700

T3 - ECS Transactions

SP - 117

EP - 122

BT - ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks

T2 - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting

Y2 - 8 October 2007 through 10 October 2007

ER -

Interface characterization in III-V CMOS nanoelectronics

Publication series

Conference

ASJC Scopus Subject Areas

Access to Document

Other files and links

Cite this