Measurement of the dc resistance of semiconductor thin film–gas systems: Comparison to several transport models

Barbara Carrico; J. Saredy; J. L. Tracy; N. G. Patel; J. Garner; L. Gasparov

doi:10.1063/1.2801020

Measurement of the dc resistance of semiconductor thin film–gas systems: Comparison to several transport models

Barbara Carrico, J. Saredy, J. L. Tracy, N. G. Patel, J. Garner, L. Gasparov

University of North Florida

Research output: Contribution to journal › Article › peer-review

Abstract

Measurements have been made of the dc resistance of a thin film semiconductor, an indium tin oxide that has been exposed to various gases (acetylene, methane, and sulfur dioxide). The resistance versus time is found to be a characteristic that serves as a possible means for detecting and identifying a gas. Three simple dc transport models are used to determine the time-dependent resistance: resistor network, dynamic Maxwell-Garnett Theory (DMGT), and a dynamic effective medium approximation (DEMA) model. The resistor network model gives only the general trend of the experimental data. The DEMA and DMGT predictions are nearly identical and independent of dimensionality. This promising application of the historic EMA and MGT models yields results that are in good agreement with experimental resistance data presented in this paper. Future directions might include an extension of these dc resistance results to the finite frequency ac and optical conductivity.

Original language	American English
Article number	083714
Journal	Journal of Applied Physics
Volume	102
Issue number	8
DOIs	https://doi.org/10.1063/1.2801020
State	Published - Oct 15 2007

Keywords

Electrical conductivity
Effective medium approximation
Electrical properties and parameters
election reform
Scanning electron microscopy
Thin films
Nano-optics
Composite models
Organic compounds
Mean field theory

Disciplines

Physics

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10.1063/1.2801020License: Unspecified

Cite this

@article{58ba90e89c2343cfaca687d4b5cf9889,

title = "Measurement of the dc resistance of semiconductor thin film–gas systems: Comparison to several transport models",

abstract = "Measurements have been made of the dc resistance of a thin film semiconductor, an indium tin oxide that has been exposed to various gases (acetylene, methane, and sulfur dioxide). The resistance versus time is found to be a characteristic that serves as a possible means for detecting and identifying a gas. Three simple dc transport models are used to determine the time-dependent resistance: resistor network, dynamic Maxwell-Garnett Theory (DMGT), and a dynamic effective medium approximation (DEMA) model. The resistor network model gives only the general trend of the experimental data. The DEMA and DMGT predictions are nearly identical and independent of dimensionality. This promising application of the historic EMA and MGT models yields results that are in good agreement with experimental resistance data presented in this paper. Future directions might include an extension of these dc resistance results to the finite frequency ac and optical conductivity.",

keywords = "Electrical conductivity, Effective medium approximation, Electrical properties and parameters, election reform, Scanning electron microscopy, Thin films, Nano-optics, Composite models, Organic compounds, Mean field theory",

author = "Barbara Carrico and J. Saredy and Tracy, {J. L.} and Patel, {N. G.} and J. Garner and L. Gasparov",

note = "Barbara Carrico, J. Saredy, J. L. Tracy, N. G. Patel, J. Garner, L. Gasparov; Measurement of the dc resistance of semiconductor thin film–gas systems: Comparison to several transport models. J. Appl. Phys. 15 October 2007; 102 (8): 083714. https://doi.org/10.1063/1.2801020",

year = "2007",

month = oct,

day = "15",

doi = "10.1063/1.2801020",

language = "American English",

volume = "102",

journal = "Journal of Applied Physics",

issn = "1089-7550",

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T1 - Measurement of the dc resistance of semiconductor thin film–gas systems

T2 - Comparison to several transport models

AU - Carrico, Barbara

AU - Saredy, J.

AU - Tracy, J. L.

AU - Patel, N. G.

AU - Garner, J.

AU - Gasparov, L.

N1 - Barbara Carrico, J. Saredy, J. L. Tracy, N. G. Patel, J. Garner, L. Gasparov; Measurement of the dc resistance of semiconductor thin film–gas systems: Comparison to several transport models. J. Appl. Phys. 15 October 2007; 102 (8): 083714. https://doi.org/10.1063/1.2801020

PY - 2007/10/15

Y1 - 2007/10/15

N2 - Measurements have been made of the dc resistance of a thin film semiconductor, an indium tin oxide that has been exposed to various gases (acetylene, methane, and sulfur dioxide). The resistance versus time is found to be a characteristic that serves as a possible means for detecting and identifying a gas. Three simple dc transport models are used to determine the time-dependent resistance: resistor network, dynamic Maxwell-Garnett Theory (DMGT), and a dynamic effective medium approximation (DEMA) model. The resistor network model gives only the general trend of the experimental data. The DEMA and DMGT predictions are nearly identical and independent of dimensionality. This promising application of the historic EMA and MGT models yields results that are in good agreement with experimental resistance data presented in this paper. Future directions might include an extension of these dc resistance results to the finite frequency ac and optical conductivity.

AB - Measurements have been made of the dc resistance of a thin film semiconductor, an indium tin oxide that has been exposed to various gases (acetylene, methane, and sulfur dioxide). The resistance versus time is found to be a characteristic that serves as a possible means for detecting and identifying a gas. Three simple dc transport models are used to determine the time-dependent resistance: resistor network, dynamic Maxwell-Garnett Theory (DMGT), and a dynamic effective medium approximation (DEMA) model. The resistor network model gives only the general trend of the experimental data. The DEMA and DMGT predictions are nearly identical and independent of dimensionality. This promising application of the historic EMA and MGT models yields results that are in good agreement with experimental resistance data presented in this paper. Future directions might include an extension of these dc resistance results to the finite frequency ac and optical conductivity.

KW - Electrical conductivity

KW - Effective medium approximation

KW - Electrical properties and parameters

KW - election reform

KW - Scanning electron microscopy

KW - Thin films

KW - Nano-optics

KW - Composite models

KW - Organic compounds

KW - Mean field theory

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DO - 10.1063/1.2801020

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