TY - GEN
T1 - Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection
AU - Srinivasan, Madhusudan
AU - Kanewala, Upulee
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025/7/21
Y1 - 2025/7/21
KW - Metamorphic Testing
KW - Prioritizing Metamorphic Relations
UR - https://www.scopus.com/pages/publications/105016190277
UR - https://www.scopus.com/inward/citedby.url?scp=105016190277&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/741cf16f-6cd0-3c69-97c9-9e87ded3053b/
U2 - 10.1109/aitest66680.2025.00025
DO - 10.1109/aitest66680.2025.00025
M3 - Literary contribution
AN - SCOPUS:105016190277
SN - 9798331589134
T3 - 2025 IEEE International Conference on Artificial Intelligence Testing (AITest)
SP - 142
EP - 151
BT - Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025
T2 - 7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025
Y2 - 21 July 2025 through 24 July 2025
ER -