Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction

R. L. Johnson-Wilke, D. Marincel, S. Zhu, M. P. Warusawithana, A. Hatt, J. Sayre, K. T. Delaney, R. Engel-Herbert, C. M. Schlepütz, J. W. Kim, V. Gopalan, N. A. Spaldin, D. G. Schlom, P. J. Ryan, S. Trolier-Mckinstry

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number174101
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume88
Issue number17
DOIs
StatePublished - Nov 1 2013
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this