Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction

R. L. Johnson-Wilke; D. Marincel; S. Zhu; M. P. Warusawithana; A. Hatt; J. Sayre; K. T. Delaney; R. Engel-Herbert; C. M. Schlepütz; J. W. Kim; V. Gopalan; N. A. Spaldin; D. G. Schlom; P. J. Ryan; S. Trolier-Mckinstry

doi:10.1103/PhysRevB.88.174101

Quantification of octahedral rotations in strained LaAlO₃ films via synchrotron x-ray diffraction

R. L. Johnson-Wilke, D. Marincel, S. Zhu, M. P. Warusawithana, A. Hatt, J. Sayre, K. T. Delaney, R. Engel-Herbert, C. M. Schlepütz, J. W. Kim, V. Gopalan, N. A. Spaldin, D. G. Schlom, P. J. Ryan, S. Trolier-Mckinstry

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	174101
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	88
Issue number	17
DOIs	https://doi.org/10.1103/PhysRevB.88.174101
State	Published - Nov 1 2013
Externally published	Yes

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.88.174101

Cite this

Johnson-Wilke, R. L., Marincel, D., Zhu, S., Warusawithana, M. P., Hatt, A., Sayre, J., Delaney, K. T., Engel-Herbert, R., Schlepütz, C. M., Kim, J. W., Gopalan, V., Spaldin, N. A., Schlom, D. G., Ryan, P. J., & Trolier-Mckinstry, S. (2013). Quantification of octahedral rotations in strained LaAlO₃ films via synchrotron x-ray diffraction. Physical Review B - Condensed Matter and Materials Physics, 88(17), Article 174101. https://doi.org/10.1103/PhysRevB.88.174101

Johnson-Wilke, RL, Marincel, D, Zhu, S, Warusawithana, MP, Hatt, A, Sayre, J, Delaney, KT, Engel-Herbert, R, Schlepütz, CM, Kim, JW, Gopalan, V, Spaldin, NA, Schlom, DG, Ryan, PJ & Trolier-Mckinstry, S 2013, 'Quantification of octahedral rotations in strained LaAlO₃ films via synchrotron x-ray diffraction', Physical Review B - Condensed Matter and Materials Physics, vol. 88, no. 17, 174101. https://doi.org/10.1103/PhysRevB.88.174101

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title = "Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction",

author = "Johnson-Wilke, \{R. L.\} and D. Marincel and S. Zhu and Warusawithana, \{M. P.\} and A. Hatt and J. Sayre and Delaney, \{K. T.\} and R. Engel-Herbert and Schlep{\"u}tz, \{C. M.\} and Kim, \{J. W.\} and V. Gopalan and Spaldin, \{N. A.\} and Schlom, \{D. G.\} and Ryan, \{P. J.\} and S. Trolier-Mckinstry",

year = "2013",

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doi = "10.1103/PhysRevB.88.174101",

language = "English",

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journal = "Physical Review B - Condensed Matter and Materials Physics",

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T1 - Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction

AU - Johnson-Wilke, R. L.

AU - Marincel, D.

AU - Zhu, S.

AU - Warusawithana, M. P.

AU - Hatt, A.

AU - Sayre, J.

AU - Delaney, K. T.

AU - Engel-Herbert, R.

AU - Schlepütz, C. M.

AU - Kim, J. W.

AU - Gopalan, V.

AU - Spaldin, N. A.

AU - Schlom, D. G.

AU - Ryan, P. J.

AU - Trolier-Mckinstry, S.

PY - 2013/11/1

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UR - https://www.scopus.com/pages/publications/84887546337

UR - https://www.scopus.com/inward/citedby.url?scp=84887546337&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.88.174101

DO - 10.1103/PhysRevB.88.174101

M3 - Article

AN - SCOPUS:84887546337

SN - 1098-0121

VL - 88

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 17

M1 - 174101

ER -

Quantification of octahedral rotations in strained LaAlO3 films via synchrotron x-ray diffraction

ASJC Scopus Subject Areas

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Quantification of octahedral rotations in strained LaAlO₃ films via synchrotron x-ray diffraction