Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$

Daniel J. Arenas; Theo Jegorel; Lev Gasparov; Hideo Kohno; Catalin Martin; David B. Tanner; Michael W. Lufaso

Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$

Daniel J. Arenas
, Theo Jegorel
, Lev Gasparov
, Hideo Kohno
, Catalin Martin
, David B. Tanner
, Michael W. Lufaso

Research output: Contribution to journal › Meeting abstract › peer-review

Original language	American English
Journal	Bulletin of the American Physical Society
Volume	57
Issue number	1
State	Published - Feb 28 2012
Event	The American Physical Society March Meeting, 2012 - Session H24: Electrical and Thermal Properties of Semiconductors, Tuesday, February 28, 2012, Boston, United States Duration: Feb 27 2012 → Mar 2 2012

Cite this

@article{cf5f59b28cca458dbfbdc2318884193e,

title = "Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi\$\_\{25\}\$InO\$\_\{39\}\$ and Bi\$\_\{25\}\$FeO\$\_\{39\}\$",

author = "Arenas, \{Daniel J.\} and Theo Jegorel and Lev Gasparov and Hideo Kohno and Catalin Martin and Tanner, \{David B.\} and Lufaso, \{Michael W.\}",

year = "2012",

month = feb,

day = "28",

language = "American English",

volume = "57",

journal = "Bulletin of the American Physical Society",

issn = "0003-0503",

number = "1",

note = "The American Physical Society March Meeting, 2012 ; Conference date: 27-02-2012 Through 02-03-2012",

}

TY - JOUR

T1 - Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$

AU - Arenas, Daniel J.

AU - Jegorel, Theo

AU - Gasparov, Lev

AU - Kohno, Hideo

AU - Martin, Catalin

AU - Tanner, David B.

AU - Lufaso, Michael W.

PY - 2012/2/28

Y1 - 2012/2/28

UR - http://absimage.aps.org/image/MAR12/MWS_MAR12-2011-007099.pdf

UR - https://meetings.aps.org/Meeting/MAR12/Session/H24.14

M3 - Meeting abstract

SN - 0003-0503

VL - 57

JO - Bulletin of the American Physical Society

JF - Bulletin of the American Physical Society

IS - 1

T2 - The American Physical Society March Meeting, 2012

Y2 - 27 February 2012 through 2 March 2012

ER -

Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$

Other files and links

Cite this