Scanning electron microscopy of nanoscale chemical patterns

Charan Srinivasan; Thomas J. Mullen; J. Nathan Hohman; Mary E. Anderson; Arrelaine A. Dameron; Anne M. Andrews; Elizabeth C. Dickey; Mark W. Horn; Paul S. Weiss

doi:10.1021/nn7000799

Scanning electron microscopy of nanoscale chemical patterns

Charan Srinivasan, Thomas J. Mullen, J. Nathan Hohman, Mary E. Anderson, Arrelaine A. Dameron, Anne M. Andrews, Elizabeth C. Dickey, Mark W. Horn, Paul S. Weiss

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	191-201
Number of pages	11
Journal	ACS Nano
Volume	1
Issue number	3
DOIs	https://doi.org/10.1021/nn7000799
State	Published - Oct 2007
Externally published	Yes

ASJC Scopus Subject Areas

General Materials Science
General Engineering
General Physics and Astronomy

Keywords

Chemical patterning
Microcontact printing
Nanolithography
Scanning electron microscopy
Self-assembly
Soft-lithography

Access to Document

10.1021/nn7000799

Cite this

@article{4746c66a41444ea3a5566b83c393db06,

title = "Scanning electron microscopy of nanoscale chemical patterns",

keywords = "Chemical patterning, Microcontact printing, Nanolithography, Scanning electron microscopy, Self-assembly, Soft-lithography",

author = "Charan Srinivasan and Mullen, \{Thomas J.\} and Hohman, \{J. Nathan\} and Anderson, \{Mary E.\} and Dameron, \{Arrelaine A.\} and Andrews, \{Anne M.\} and Dickey, \{Elizabeth C.\} and Horn, \{Mark W.\} and Weiss, \{Paul S.\}",

year = "2007",

month = oct,

doi = "10.1021/nn7000799",

language = "English",

volume = "1",

pages = "191--201",

number = "3",

}

TY - JOUR

T1 - Scanning electron microscopy of nanoscale chemical patterns

AU - Srinivasan, Charan

AU - Mullen, Thomas J.

AU - Hohman, J. Nathan

AU - Anderson, Mary E.

AU - Dameron, Arrelaine A.

AU - Andrews, Anne M.

AU - Dickey, Elizabeth C.

AU - Horn, Mark W.

AU - Weiss, Paul S.

PY - 2007/10

Y1 - 2007/10

KW - Chemical patterning

KW - Microcontact printing

KW - Nanolithography

KW - Scanning electron microscopy

KW - Self-assembly

KW - Soft-lithography

UR - https://www.scopus.com/pages/publications/48749097916

UR - https://www.scopus.com/inward/citedby.url?scp=48749097916&partnerID=8YFLogxK

U2 - 10.1021/nn7000799

DO - 10.1021/nn7000799

M3 - Article

C2 - 19206649

AN - SCOPUS:48749097916

SN - 1936-0851

VL - 1

SP - 191

EP - 201

JO - ACS Nano

JF - ACS Nano

IS - 3

ER -

Scanning electron microscopy of nanoscale chemical patterns

ASJC Scopus Subject Areas

Keywords

Access to Document

Other files and links

Cite this