TY - JOUR
T1 - The removal of nanoparticles from sub-micron trenches using megasonics
AU - Karimi, Pegah
AU - Kim, Taehoon
AU - Aceros, Juan
AU - Park, Jingoo
AU - Busnaina, Ahmed A.
PY - 2010/11
Y1 - 2010/11
KW - Effect of power on particle removal from trenches
KW - Effect of time on particle removal from trenches
KW - Megasonic cleaning
KW - Nanoparticle removal from trenches
KW - Nanoparticle removal using megasonic
KW - Trench cleaning using megasonic
UR - http://www.scopus.com/inward/record.url?scp=77955227865&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77955227865&partnerID=8YFLogxK
U2 - 10.1016/j.mee.2009.11.052
DO - 10.1016/j.mee.2009.11.052
M3 - Article
AN - SCOPUS:77955227865
SN - 0167-9317
VL - 87
SP - 1665
EP - 1668
JO - Microelectronic Engineering
JF - Microelectronic Engineering
IS - 9
ER -