The removal of nanoparticles from sub-micron trenches using megasonics

Pegah Karimi, Taehoon Kim, Juan Aceros, Jingoo Park, Ahmed A. Busnaina

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1665-1668
Number of pages4
JournalMicroelectronic Engineering
Volume87
Issue number9
DOIs
StatePublished - Nov 2010
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Keywords

  • Effect of power on particle removal from trenches
  • Effect of time on particle removal from trenches
  • Megasonic cleaning
  • Nanoparticle removal from trenches
  • Nanoparticle removal using megasonic
  • Trench cleaning using megasonic

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