Thin film substrates from the Raman spectroscopy point of view

L. Gasparov, T. Jegorel, L. Loetgering, S. Middey, J. Chakhalian

Research output: Contribution to journalArticlepeer-review

Abstract

We have investigated ten standard single crystal substrates of complex oxides on the account of their applicability in the Raman spectroscopy-based thin film research. In this study, we suggest a spectra normalization procedure that utilizes a comparison of the substrate's Raman spectra to those of well-established Raman reference materials. We demonstrate that MgO, LaGaO3, (LaAlO3)0.3(Sr2AlTaO6)0.7 (LSAT), DyScO3, YAlO3, and LaAlO3 can be of potential use for Raman-based thin film research. At the same time TiO2 (rutile), NdGaO3, SrLaAlO4, and SrTiO3 single crystals exhibit multiple phonon modes accompanied by strong Raman background that substantially hinder Raman-based thin film experiments.
Original languageAmerican English
Pages (from-to)465-469
Number of pages5
JournalJournal of Raman Spectroscopy
Volume45
Issue number6
DOIs
StatePublished - Jun 2014

Keywords

  • Raman spectroscopy
  • thin film substrates
  • correlated oxide materials

Disciplines

  • Atomic, Molecular and Optical Physics
  • Physics
  • Quantum Physics
  • Analytical Chemistry

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