Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

Madhusudan Srinivasan; Upulee Kanewala

doi:10.3390/electronics13173380

Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

Madhusudan Srinivasan, Upulee Kanewala

School of Computing

East Carolina University

Producción científica: Article › revisión exhaustiva

Idioma original	English
Número de artículo	3380
Publicación	Electronics (Switzerland)
Volumen	13
N.º	17
DOI	https://doi.org/10.3390/electronics13173380
Estado	Published - sept 2024

ASJC Scopus Subject Areas

Control and Systems Engineering
Signal Processing
Hardware and Architecture
Computer Networks and Communications
Electrical and Electronic Engineering

Acceder al documento

10.3390/electronics13173380

Otros archivos y enlaces

Citar esto

@article{3baa609a0bb2428f89d036102bdfc146,

title = "Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization",

keywords = "metamorphic relation prioritization, metamorphic relations, metamorphic testing, software testing, test prioritization, testing and validation",

author = "Madhusudan Srinivasan and Upulee Kanewala",

note = "Publisher Copyright: {\textcopyright} 2024 by the authors.",

year = "2024",

month = sep,

doi = "10.3390/electronics13173380",

language = "English",

volume = "13",

number = "17",

}

TY - JOUR

T1 - Improving Early Fault Detection in Machine Learning Systems Using Data Diversity-Driven Metamorphic Relation Prioritization

AU - Srinivasan, Madhusudan

AU - Kanewala, Upulee

PY - 2024/9

Y1 - 2024/9

KW - metamorphic relation prioritization

KW - metamorphic relations

KW - metamorphic testing

KW - software testing

KW - test prioritization

KW - testing and validation

UR - http://www.scopus.com/inward/record.url?scp=85203627200&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85203627200&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/17307dfc-8345-3dd1-8eb6-f9fb31e1c3fb/

U2 - 10.3390/electronics13173380

DO - 10.3390/electronics13173380

M3 - Article

AN - SCOPUS:85203627200

VL - 13

JO - Electronics (Switzerland)

JF - Electronics (Switzerland)

IS - 17

M1 - 3380

ER -