@inproceedings{e23c9ce82b634f6dbc4d7f425ec9b959,
title = "Interface characterization in III-V CMOS nanoelectronics",
author = "Goncharova, \{L. V.\} and O. Celik and T. Gustafsson and E. Garfunkel and M. Warusawithana and Schlom, \{D. G.\} and H. Wen and Santos, \{M. B.\} and Safak Sayan and Wilman Tsai and Niti Goel",
year = "2007",
doi = "10.1149/1.2779553",
language = "English",
isbn = "9781566775700",
series = "ECS Transactions",
number = "4",
pages = "117--122",
booktitle = "ECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks",
edition = "4",
note = "5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting ; Conference date: 08-10-2007 Through 10-10-2007",
}