Predicting at-risk students in a circuit analysis course using supervised machine learning

James P. Becker; Emily Sior; Jerad Hoy; Indika Kahanda

Predicting at-risk students in a circuit analysis course using supervised machine learning

James P. Becker, Emily Sior, Jerad Hoy, Indika Kahanda

Montana State University

Producción científica: Conference article › revisión exhaustiva

Idioma original	English
Publicación	ASEE Annual Conference and Exposition, Conference Proceedings
Estado	Published - jun 15 2019
Publicado de forma externa	Sí
Evento	126th ASEE Annual Conference and Exposition: Charged Up for the Next 125 Years, ASEE 2019 - Tampa, United States Duración: jun 15 2019 → jun 19 2019

ASJC Scopus Subject Areas

General Engineering

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title = "Predicting at-risk students in a circuit analysis course using supervised machine learning",

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T1 - Predicting at-risk students in a circuit analysis course using supervised machine learning

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AU - Sior, Emily

AU - Hoy, Jerad

AU - Kahanda, Indika

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T2 - 126th ASEE Annual Conference and Exposition: Charged Up for the Next 125 Years, ASEE 2019

Y2 - 15 June 2019 through 19 June 2019

ER -