Predicting at-risk students in a circuit analysis course using supervised machine learning

James P. Becker; Emily Sior; Jerad Hoy; Indika Kahanda

Predicting at-risk students in a circuit analysis course using supervised machine learning

James P. Becker
, Emily Sior
, Jerad Hoy
, Indika Kahanda

Producción científica: Conference article › revisión exhaustiva

Idioma original	English
Publicación	ASEE Annual Conference and Exposition, Conference Proceedings
Estado	Published - jun 15 2019
Publicado de forma externa	Sí
Evento	126th ASEE Annual Conference and Exposition: Charged Up for the Next 125 Years, ASEE 2019 - Tampa, United States Duración: jun 15 2019 → jun 19 2019

ASJC Scopus Subject Areas

General Engineering

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title = "Predicting at-risk students in a circuit analysis course using supervised machine learning",

author = "Becker, \{James P.\} and Emily Sior and Jerad Hoy and Indika Kahanda",

note = "Publisher Copyright: {\textcopyright} American Society for Engineering Education, 2019; 126th ASEE Annual Conference and Exposition: Charged Up for the Next 125 Years, ASEE 2019 ; Conference date: 15-06-2019 Through 19-06-2019",

year = "2019",

month = jun,

day = "15",

language = "English",

}

TY - JOUR

T1 - Predicting at-risk students in a circuit analysis course using supervised machine learning

AU - Becker, James P.

AU - Sior, Emily

AU - Hoy, Jerad

AU - Kahanda, Indika

N1 - Publisher Copyright: © American Society for Engineering Education, 2019

PY - 2019/6/15

Y1 - 2019/6/15

UR - https://www.scopus.com/pages/publications/85078775784

UR - https://www.scopus.com/pages/publications/85078775784#tab=citedBy

M3 - Conference article

AN - SCOPUS:85078775784

SN - 2153-5965

JO - ASEE Annual Conference and Exposition, Conference Proceedings

JF - ASEE Annual Conference and Exposition, Conference Proceedings

T2 - 126th ASEE Annual Conference and Exposition: Charged Up for the Next 125 Years, ASEE 2019

Y2 - 15 June 2019 through 19 June 2019

ER -