Predicting number of bugs before launch: An investigation based on machine learning

Shyam Rajendren; Sandeep Reddivari

doi:10.1109/COMPSAC51774.2021.00205

Predicting number of bugs before launch: An investigation based on machine learning

Shyam Rajendren, Sandeep Reddivari

School of Computing

University of North Florida

Producción científica: Literary contribution

Idioma original	English
Título de la publicación alojada	Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021
Editores	W. K. Chan, Bill Claycomb, Hiroki Takakura, Ji-Jiang Yang, Yuuichi Teranishi, Dave Towey, Sergio Segura, Hossain Shahriar, Sorel Reisman, Sheikh Iqbal Ahamed
Páginas	1403-1404
Número de páginas	2
ISBN (versión digital)	9781665424639
DOI	https://doi.org/10.1109/COMPSAC51774.2021.00205
Estado	Published - jul 2021
Evento	45th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2021 - Virtual, Online, Spain Duración: jul 12 2021 → jul 16 2021

Serie de la publicación

Nombre	Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021

Conference

Conference	45th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2021
País/Territorio	Spain
Ciudad	Virtual, Online
Período	7/12/21 → 7/16/21

ASJC Scopus Subject Areas

Artificial Intelligence
Computer Science Applications
Software

Acceder al documento

10.1109/COMPSAC51774.2021.00205

Otros archivos y enlaces

Citar esto

Rajendren, S., & Reddivari, S. (2021). Predicting number of bugs before launch: An investigation based on machine learning. En W. K. Chan, B. Claycomb, H. Takakura, J.-J. Yang, Y. Teranishi, D. Towey, S. Segura, H. Shahriar, S. Reisman, & S. I. Ahamed (Eds.), Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021 (pp. 1403-1404). (Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021). https://doi.org/10.1109/COMPSAC51774.2021.00205

Predicting number of bugs before launch: An investigation based on machine learning. / Rajendren, Shyam; Reddivari, Sandeep.
Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021. ed. / W. K. Chan; Bill Claycomb; Hiroki Takakura; Ji-Jiang Yang; Yuuichi Teranishi; Dave Towey; Sergio Segura; Hossain Shahriar; Sorel Reisman; Sheikh Iqbal Ahamed. 2021. p. 1403-1404 (Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021).

Producción científica: Literary contribution

Rajendren, S & Reddivari, S 2021, Predicting number of bugs before launch: An investigation based on machine learning. En WK Chan, B Claycomb, H Takakura, J-J Yang, Y Teranishi, D Towey, S Segura, H Shahriar, S Reisman & SI Ahamed (eds.), Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021. Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021, pp. 1403-1404, 45th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2021, Virtual, Online, Spain, 7/12/21. https://doi.org/10.1109/COMPSAC51774.2021.00205

Rajendren S, Reddivari S. Predicting number of bugs before launch: An investigation based on machine learning. En Chan WK, Claycomb B, Takakura H, Yang JJ, Teranishi Y, Towey D, Segura S, Shahriar H, Reisman S, Ahamed SI, editores, Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021. 2021. p. 1403-1404. (Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021). doi: 10.1109/COMPSAC51774.2021.00205

Rajendren, Shyam ; Reddivari, Sandeep. / Predicting number of bugs before launch : An investigation based on machine learning. Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021. editor / W. K. Chan ; Bill Claycomb ; Hiroki Takakura ; Ji-Jiang Yang ; Yuuichi Teranishi ; Dave Towey ; Sergio Segura ; Hossain Shahriar ; Sorel Reisman ; Sheikh Iqbal Ahamed. 2021. pp. 1403-1404 (Proceedings - 2021 IEEE 45th Annual Computers, Software, and Applications Conference, COMPSAC 2021).

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