Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection

Madhusudan Srinivasan; Upulee Kanewala

doi:10.1109/aitest66680.2025.00025

Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection

Madhusudan Srinivasan
, Upulee Kanewala

School of Computing

East Carolina University

Producción científica: Literary contribution

Idioma original	English
Título de la publicación alojada	Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025
Páginas	142-151
Número de páginas	10
ISBN (versión digital)	9798331589134
DOI	https://doi.org/10.1109/aitest66680.2025.00025
Estado	Published - jul 21 2025
Evento	7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025 - Tucson, United States Duración: jul 21 2025 → jul 24 2025

Serie de la publicación

Nombre	2025 IEEE International Conference on Artificial Intelligence Testing (AITest)

Conference

Conference	7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025
País/Territorio	United States
Ciudad	Tucson
Período	7/21/25 → 7/24/25

ASJC Scopus Subject Areas

Artificial Intelligence
Computer Science Applications
Computer Vision and Pattern Recognition
Safety, Risk, Reliability and Quality

Acceder al documento

10.1109/aitest66680.2025.00025

Otros archivos y enlaces

Citar esto

Srinivasan, M., & Kanewala, U. (2025). Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection. En Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025 (pp. 142-151). (2025 IEEE International Conference on Artificial Intelligence Testing (AITest)). https://doi.org/10.1109/aitest66680.2025.00025

Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection. / Srinivasan, Madhusudan; Kanewala, Upulee.
Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025. 2025. p. 142-151 (2025 IEEE International Conference on Artificial Intelligence Testing (AITest)).

Producción científica: Literary contribution

Srinivasan, M & Kanewala, U 2025, Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection. En Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025. 2025 IEEE International Conference on Artificial Intelligence Testing (AITest), pp. 142-151, 7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025, Tucson, United States, 7/21/25. https://doi.org/10.1109/aitest66680.2025.00025

@inproceedings{722c9eb66b00418c9258dc31c1cf4988,

title = "Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection",

keywords = "Metamorphic Testing, Prioritizing Metamorphic Relations",

author = "Madhusudan Srinivasan and Upulee Kanewala",

note = "Publisher Copyright: {\textcopyright} 2025 IEEE.; 7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025 ; Conference date: 21-07-2025 Through 24-07-2025",

year = "2025",

month = jul,

day = "21",

doi = "10.1109/aitest66680.2025.00025",

language = "English",

isbn = "9798331589134",

series = "2025 IEEE International Conference on Artificial Intelligence Testing (AITest)",

pages = "142--151",

booktitle = "Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025",

}

TY - GEN

T1 - Prioritizing Metamorphic Relations via Execution Profile Dissimilarity for Improved Fault Detection

AU - Srinivasan, Madhusudan

AU - Kanewala, Upulee

PY - 2025/7/21

Y1 - 2025/7/21

KW - Metamorphic Testing

KW - Prioritizing Metamorphic Relations

UR - https://www.scopus.com/pages/publications/105016190277

UR - https://www.scopus.com/pages/publications/105016190277#tab=citedBy

UR - https://www.mendeley.com/catalogue/741cf16f-6cd0-3c69-97c9-9e87ded3053b/

U2 - 10.1109/aitest66680.2025.00025

DO - 10.1109/aitest66680.2025.00025

M3 - Literary contribution

AN - SCOPUS:105016190277

SN - 9798331589134

T3 - 2025 IEEE International Conference on Artificial Intelligence Testing (AITest)

SP - 142

EP - 151

BT - Proceedings - 2025 IEEE International Conference on Artificial Intelligence Testing, AITest 2025

T2 - 7th IEEE International Conference on Artificial Intelligence Testing, AITest 2025

Y2 - 21 July 2025 through 24 July 2025

ER -