Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$

Daniel J. Arenas, Theo Jegorel, Lev Gasparov, Hideo Kohno, Catalin Martin, David B. Tanner, Michael W. Lufaso

Producción científica: Meeting abstractrevisión exhaustiva

Idioma originalAmerican English
PublicaciónBulletin of the American Physical Society
Volumen57
N.º1
EstadoPublished - feb 28 2012
EventoThe American Physical Society March Meeting, 2012 - Session H24: Electrical and Thermal Properties of Semiconductors, Tuesday, February 28, 2012, Boston, United States
Duración: feb 27 2012mar 2 2012

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