Idioma original | American English |
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Publicación | Bulletin of the American Physical Society |
Volumen | 57 |
N.º | 1 |
Estado | Published - feb 28 2012 |
Evento | The American Physical Society March Meeting, 2012 - Session H24: Electrical and Thermal Properties of Semiconductors, Tuesday, February 28, 2012, Boston, United States Duración: feb 27 2012 → mar 2 2012 |
Raman Spectroscopy and Scanning Electron Microscopy of the Bismuth Sillenites Bi$_{25}$InO$_{39}$ and Bi$_{25}$FeO$_{39}$
Daniel J. Arenas, Theo Jegorel, Lev Gasparov, Hideo Kohno, Catalin Martin, David B. Tanner, Michael W. Lufaso
Producción científica: Meeting abstract › revisión exhaustiva