Thin film substrates from the Raman spectroscopy point of view

L. Gasparov, T. Jegorel, L. Loetgering, S. Middey, J. Chakhalian

Producción científica: Articlerevisión exhaustiva

Resumen

We have investigated ten standard single crystal substrates of complex oxides on the account of their applicability in the Raman spectroscopy-based thin film research. In this study, we suggest a spectra normalization procedure that utilizes a comparison of the substrate's Raman spectra to those of well-established Raman reference materials. We demonstrate that MgO, LaGaO3, (LaAlO3)0.3(Sr2AlTaO6)0.7 (LSAT), DyScO3, YAlO3, and LaAlO3 can be of potential use for Raman-based thin film research. At the same time TiO2 (rutile), NdGaO3, SrLaAlO4, and SrTiO3 single crystals exhibit multiple phonon modes accompanied by strong Raman background that substantially hinder Raman-based thin film experiments.
Idioma originalAmerican English
Páginas (desde-hasta)465-469
Número de páginas5
PublicaciónJournal of Raman Spectroscopy
Volumen45
N.º6
DOI
EstadoPublished - jun 2014

Disciplines

  • Atomic, Molecular and Optical Physics
  • Physics
  • Quantum Physics
  • Analytical Chemistry

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